Traditional semiconductor solutions fall short. JRC’s patented LEAP© Standard Cell Libraries and Custom Logic Cells are engineered for these exact environments, radiation-hardened, power-optimized, and ready to perform in the most mission-critical conditions.
JRC delivers silicon-proven radiation-hardened microelectronics through our proprietary LEAP© (Layout Design through Error Aware Positioning) methodology. These standard cell libraries and custom logic cells are designed to dramatically reduce error rates while maintaining exceptional performance and efficiency. Compatible with modern commercial foundries and scalable across process nodes, LEAP™ empowers rapid, resilient development for mission-critical applications.
Our Precision Logic Tools for LEAP© Standard Cell Libraries.
A patented design library optimized to reduce single event error rates through JRC’s Layout LEAP© methodology
Tailored logic cell creation for strategic deterrent, space, and aerospace system integration
Proprietary resilience-enhancing techniques validated for Total Ionizing Dose (TID) and Single Event Effects (SEE) without sacrificing performance
Proven silicon across 180nm to 3nm nodes, ensuring design portability and compatibility with evolving foundry tech
Seamless plug-in compatibility with commercial EDA tools and standard design flows for rapid deployment
Logic cells designed for extended mission durations with minimal power draw
What Sets Us Apart
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